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"TOV: Sequential Test Generation by Ordering of Test Vectors."

Irith Pomeranz, Sudhakar M. Reddy (2010)

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DOI: 10.1109/TCAD.2010.2041985

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Sudhakar M. Reddy:
TOV: Sequential Test Generation by Ordering of Test Vectors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(3): 454-465 (2010)

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