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"EBIST: a novel test generator with built-in fault detection capability."

Dhiraj K. Pradhan, Chunsheng Liu (2005)

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DOI: 10.1109/TCAD.2005.850815

access: closed

type: Journal Article

metadata version: 2020-09-24

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Dhiraj K. Pradhan, Chunsheng Liu:
EBIST: a novel test generator with built-in fault detection capability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(9): 1457-1466 (2005)

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