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"On the fault coverage of gate delay fault detecting tests."

Ankan K. Pramanick, Sudhakar M. Reddy (1997)

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DOI: 10.1109/43.559333

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/PramanickR97
Ankan K. Pramanick, Sudhakar M. Reddy:
On the fault coverage of gate delay fault detecting tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(1): 78-94 (1997)

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