"Highly Efficient Test Response Compaction Using a Hierarchical X-Masking ..."

Thomas Rabenalt et al. (2012)

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DOI: 10.1109/TCAD.2011.2181847

access: closed

type: Journal Article

metadata version: 2020-09-24

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Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel:
Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 950-957 (2012)

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