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"Embedded deterministic test."

Janusz Rajski et al. (2004)

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DOI: 10.1109/TCAD.2004.826558

access: closed

type: Journal Article

metadata version: 2020-09-24

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Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee:
Embedded deterministic test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(5): 776-792 (2004)

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