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"Automatic test vector cultivation for sequential VLSI circuits using ..."

Daniel G. Saab, Youssef Saab, Jacob A. Abraham (1996)

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DOI: 10.1109/43.541447

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/SaabSA96
Daniel G. Saab, Youssef Saab, Jacob A. Abraham:
Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(10): 1278-1285 (1996)

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