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"Improved deterministic test pattern generation with applications to ..."

Michael H. Schulz, Elisabeth Auth (1989)

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DOI: 10.1109/43.31539

access: closed

type: Journal Article

metadata version: 2020-09-24

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Michael H. Schulz, Elisabeth Auth:
Improved deterministic test pattern generation with applications to redundancy identification. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(7): 811-816 (1989)

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