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"Test Metrics Model for Analog Test Development."

Haralampos-G. D. Stratigopoulos (2012)

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DOI: 10.1109/TCAD.2012.2185931

access: closed

type: Journal Article

metadata version: 2020-09-24

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Haralampos-G. D. Stratigopoulos:
Test Metrics Model for Analog Test Development. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1116-1128 (2012)

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