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"Experimental Validation of a Novel Methodology for Electromigration ..."

Valeriy Sukharev et al. (2022)

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DOI: 10.1109/TCAD.2021.3134886

access: closed

type: Journal Article

metadata version: 2022-11-13

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  - https://dblp.org/rec/journals/tcad/SukharevKNYKCTZ22
Valeriy Sukharev, Armen Kteyan, Farid N. Najm, Yong Hyeon Yi, Chris H. Kim, Jun-Ho Choy, Sofya Torosyan, Yu Zhu:
Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4837-4850 (2022)

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