"A New ATPG Technique (ExpoTan) for Testing Analog Circuits."

B. K. S. V. L. Varaprasad et al. (2007)

Details and statistics

DOI: 10.1109/TCAD.2006.882596

access: closed

type: Journal Article

metadata version: 2021-10-14

a service of  Schloss Dagstuhl - Leibniz Center for Informatics