Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Scan-Chain Partition for High Test-Data Compressibility and Low Shift ..."

Sying-Jyan Wang et al. (2009)

> Home

Details and statistics

DOI: 10.1109/TCAD.2009.2015741

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/WangLCSC09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/WangLCSC09
Sying-Jyan Wang, Katherine Shu-Min Li, Shih-Cheng Chen, Huai-Yan Shiu, Yun-Lung Chu:
Scan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constraint. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(5): 716-727 (2009)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.