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"Scan-based BIST fault diagnosis."

Yuejian Wu, Saman Adham (1999)

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DOI: 10.1109/43.743733

access: closed

type: Journal Article

metadata version: 2020-09-24

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Yuejian Wu, Saman Adham:
Scan-based BIST fault diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(2): 203-211 (1999)

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