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"Identifying Reliability-Critical Primary Inputs of Combinational Circuits ..."
Jie Xiao et al. (2022)
- Jie Xiao
, Wenbo Chen, Jungang Lou
, Jianhui Jiang
, Qianwei Zhou
:
Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4708-4720 (2022)
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