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"Reliable State Retention-Based Embedded Processors Through Monitoring and ..."

Sheng Yang et al. (2011)

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DOI: 10.1109/TCAD.2011.2166590

access: closed

type: Journal Article

metadata version: 2023-05-15

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Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, David Flynn, Sachin Idgunji:
Reliable State Retention-Based Embedded Processors Through Monitoring and Recovery. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1773-1785 (2011)

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