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"Statistical Analysis of ENOB and Yield in Binary Weighted ADCs and DACS ..."

Jeffrey Fredenburg, Michael P. Flynn (2012)

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DOI: 10.1109/TCSI.2011.2177006

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tcas/FredenburgF12
Jeffrey Fredenburg, Michael P. Flynn:
Statistical Analysis of ENOB and Yield in Binary Weighted ADCs and DACS With Random Element Mismatch. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(7): 1396-1408 (2012)

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