"Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm ..."

Saket Gupta et al. (2016)

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DOI: 10.1109/TCSI.2016.2556120

access: closed

type: Journal Article

metadata version: 2020-05-22

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Saket Gupta, Carl Monzel, Daniel S. Reed, Yifei Zhang, Mark Winter, Myron Buer:
Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(7): 1014-1022 (2016)

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