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"Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With ..."

Yu Pu et al. (2011)

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DOI: 10.1109/TCSII.2011.2149050

access: closed

type: Journal Article

metadata version: 2020-05-27

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  - https://dblp.org/rec/journals/tcas/PuZIMKTNSS11
Yu Pu, Xin Zhang, Katsuyuki Ikeuchi, Atsushi Muramatsu, Atsushi Kawasumi, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai:
Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits. IEEE Trans. Circuits Syst. II Express Briefs 58-II(5): 294-298 (2011)

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