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"Performance, Metastability, and Soft-Error Robustness Trade-offs for ..."

David Rennie et al. (2012)

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DOI: 10.1109/TCSI.2012.2206505

access: closed

type: Journal Article

metadata version: 2020-05-22

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David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong:
Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(8): 1626-1634 (2012)

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