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"Analysis and Modeling of Internal State Variables for Dynamic Effects of ..."

Yang Shang, Wei Fei, Hao Yu (2012)

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DOI: 10.1109/TCSI.2011.2180441

access: closed

type: Journal Article

metadata version: 2020-05-22

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Yang Shang, Wei Fei, Hao Yu:
Analysis and Modeling of Internal State Variables for Dynamic Effects of Nonvolatile Memory Devices. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(9): 1906-1918 (2012)

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