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"A Non-Redundant Latch With Key-Node-Upset Obstacle of Beneficial ..."

Yan Liu et al. (2023)

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DOI: 10.1109/TCSI.2023.3237706

access: closed

type: Journal Article

metadata version: 2023-09-30

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Yan Liu, Yan Li, Xu Cheng, Jun Han, Xiaoyang Zeng:
A Non-Redundant Latch With Key-Node-Upset Obstacle of Beneficial Efficiency for Harsh Environments Applications. IEEE Trans. Circuits Syst. I Regul. Pap. 70(4): 1639-1648 (2023)

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