"An Interconnect Reliability-Driven Routing Technique for Electromigration ..."

Xiaodao Chen et al. (2012)

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DOI: 10.1109/TDSC.2010.57

access: closed

type: Journal Article

metadata version: 2025-09-06

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Xiaodao Chen, Chen Liao, Tongquan Wei, Shiyan Hu:
An Interconnect Reliability-Driven Routing Technique for Electromigration Failure Avoidance. IEEE Trans. Dependable Secur. Comput. 9(5): 770-776 (2012)

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