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"High-Resolution Nondestructive Test Probes Based on Magnetoresistive Sensors."

Diogo M. Caetano et al. (2019)

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DOI: 10.1109/TIE.2018.2879306

access: closed

type: Journal Article

metadata version: 2020-06-15

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  - https://dblp.org/rec/journals/tie/CaetanoRFPFCRFP19
Diogo M. Caetano, Taimur Gibran Rabuske, Jorge R. Fernandes, Matthias Pelkner, Claude Fermon, Susana Cardoso, Belen Ribes, Fernando Franco, Johannes Paul, Moisés Simões Piedade, Paulo P. Freitas:
High-Resolution Nondestructive Test Probes Based on Magnetoresistive Sensors. IEEE Trans. Ind. Electron. 66(9): 7326-7337 (2019)

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