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"Statistical Diagnosis for Quality-Related Faults in BIW Assembly Process."

Yu-Kai Fu et al. (2023)

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DOI: 10.1109/TIE.2022.3146637

access: closed

type: Journal Article

metadata version: 2023-03-21

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  - https://dblp.org/rec/journals/tie/FuYMCZ23
Yu-Kai Fu, Guang-Hong Yang, Hong-Jun Ma, Hao Chen, Bo Zhu:
Statistical Diagnosis for Quality-Related Faults in BIW Assembly Process. IEEE Trans. Ind. Electron. 70(1): 898-906 (2023)

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