"A Method to Characterize the Shrinking of Safe Operation Area of ..."

Chunlin Lv et al. (2023)

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DOI: 10.1109/TIE.2022.3161823

access: closed

type: Journal Article

metadata version: 2023-03-28

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Chunlin Lv, Jinjun Liu, Yan Zhang, Jinpeng Yin, Rui Cao, Yang Li, Xue Liu:
A Method to Characterize the Shrinking of Safe Operation Area of Metallized Film Capacitor Considering Electrothermal Coupling and Aging in Power Electronics Applications. IEEE Trans. Ind. Electron. 70(2): 1993-2002 (2023)

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