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"DYnet++: A Deep Learning Based Single-Shot Phase-Measuring Deflectometry ..."

The Manh Nguyen, Young-Sik Ghim, Hyug-Gyo Rhee (2024)

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DOI: 10.1109/TIE.2023.3253940

access: open

type: Journal Article

metadata version: 2023-09-12

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  dblp key:
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  - https://dblp.org/rec/journals/tie/NguyenGR24
The Manh Nguyen, Young-Sik Ghim, Hyug-Gyo Rhee:
DYnet++: A Deep Learning Based Single-Shot Phase-Measuring Deflectometry for the 3-D Measurement of Complex Free-Form Surfaces. IEEE Trans. Ind. Electron. 71(2): 2112-2121 (2024)

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