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"Noise Immunity and its Temperature Characteristics Study of the ..."

Jing Zhu et al. (2018)

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DOI: 10.1109/TIE.2017.2750615

access: closed

type: Journal Article

metadata version: 2022-07-12

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  - https://dblp.org/rec/journals/tie/ZhuZSLSGZ18
Jing Zhu, Yunwu Zhang, Weifeng Sun, Yangyang Lu, Longxing Shi, Yan Gu, Sen Zhang:
Noise Immunity and its Temperature Characteristics Study of the Capacitive-Loaded Level Shift Circuit for High Voltage Gate Drive IC. IEEE Trans. Ind. Electron. 65(4): 3027-3034 (2018)

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