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"A Virtual Metrology System for Predicting End-of-Line Electrical ..."
Tian-Hong Pan et al. (2011)
- Tian-Hong Pan, Bi-Qi Sheng, David Shan-Hill Wong, Shi-Shang Jang:
A Virtual Metrology System for Predicting End-of-Line Electrical Properties Using a MANCOVA Model With Tools Clustering. IEEE Trans. Ind. Informatics 7(2): 187-195 (2011)
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