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"Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter ..."

Shu Chen, Mohammed N. Afsar, D. Sakdatorn (2008)

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DOI: 10.1109/TIM.2007.913594

access: closed

type: Journal Article

metadata version: 2020-06-08

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Shu Chen, Mohammed N. Afsar, D. Sakdatorn:
Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths. IEEE Trans. Instrum. Meas. 57(4): 706-715 (2008)

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