"Device Verification Testing of High-Speed Analog-to-Digital Converters in ..."

Seokjin Kim, Radmil Elkis, Martin Peckerar (2009)

Details and statistics

DOI: 10.1109/TIM.2008.2005948

access: closed

type: Journal Article

metadata version: 2020-06-08

a service of  Schloss Dagstuhl - Leibniz Center for Informatics