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"A New Method for RTS Noise of Semiconductor Devices Identification."

Alicja Konczakowska, Jacek Cichosz, Arkadiusz Szewczyk (2008)

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DOI: 10.1109/TIM.2007.915098

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - journals/tim/KonczakowskaCS08
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  - https://dblp.org/rec/journals/tim/KonczakowskaCS08
Alicja Konczakowska, Jacek Cichosz, Arkadiusz Szewczyk:
A New Method for RTS Noise of Semiconductor Devices Identification. IEEE Trans. Instrum. Meas. 57(6): 1199-1206 (2008)

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