Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline ..."

Peng Luan et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TIM.2020.2995970

access: closed

type: Journal Article

metadata version: 2024-04-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/LuanWZLLWD20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/LuanWZLLWD20
Peng Luan, Yibang Wang, Wei Zhao, Chen Liu, Faguo Liang, Aihua Wu, Jing Du:
Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy. IEEE Trans. Instrum. Meas. 69(11): 8874-8880 (2020)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.