"A Dual Current Probe Method With Enhanced Low-Frequency Sensitivity for ..."

Jaewon Rhee et al. (2025)

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DOI: 10.1109/TIM.2025.3588979

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type: Journal Article

metadata version: 2025-09-11

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Jaewon Rhee, Changmin Lee, Sanguk Lee, Seongho Woo, Yujun Shin, Seungyoung Ahn:
A Dual Current Probe Method With Enhanced Low-Frequency Sensitivity for High-Voltage Dynamic Capacitance Measurement. IEEE Trans. Instrum. Meas. 74: 1-11 (2025)

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