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"Novel IEEE-STD-1241-Based Test Methods for Analog-to-Information Converter."

Veronica M. L. Silva et al. (2020)

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DOI: 10.1109/TIM.2019.2914132

access: closed

type: Journal Article

metadata version: 2020-06-15

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Veronica M. L. Silva, Cleonilson Protásio de Souza, Raimundo C. S. Freire, Bruno Willian de Souza Arruda, Edmar C. Gurjao, Vanderson L. Reis:
Novel IEEE-STD-1241-Based Test Methods for Analog-to-Information Converter. IEEE Trans. Instrum. Meas. 69(4): 1609-1619 (2020)

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