"Remote Online Two-Step Stress Lifetime Acceleration Test System for ..."

Lihong Zhu et al. (2021)

> Home

Details and statistics

DOI: 10.1109/TIM.2021.3094627

access: closed

type: Journal Article

metadata version: 2024-01-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/ZhuZRGGGLWCL21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/ZhuZRGGGLWCL21
Lihong Zhu, Qiu-Wei Zheng, Yu-Jiao Ruan, Wei-Jie Guo, Yulin Gao, Ziquan Guo, Yue Lin, Tingzhu Wu, Zhong Chen, Yi-Jun Lu:
Remote Online Two-Step Stress Lifetime Acceleration Test System for Ultraviolet Light-Emitting Diodes. IEEE Trans. Instrum. Meas. 70: 1-7 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.