"Ellipse Fitting Using the Finite Rate of Innovation Sampling Principle."

Satish Mulleti, Chandra Sekhar Seelamantula (2016)

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DOI: 10.1109/TIP.2015.2511580

access: closed

type: Journal Article

metadata version: 2020-05-10

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Satish Mulleti, Chandra Sekhar Seelamantula:
Ellipse Fitting Using the Finite Rate of Innovation Sampling Principle. IEEE Trans. Image Process. 25(3): 1451-1464 (2016)

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