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"Using Bayesian network technology to predict the semiconductor ..."

Xiaodong Fang, Chan Chang, Genggeng Liu (2021)

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DOI: 10.1007/S11227-021-03649-Z

access: closed

type: Journal Article

metadata version: 2021-07-26

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Xiaodong Fang, Chan Chang, Genggeng Liu:
Using Bayesian network technology to predict the semiconductor manufacturing yield rate in IoT. J. Supercomput. 77(8): 9020-9045 (2021)

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