"Enhanced wafer map defect pattern classification through stacking ensemble ..."

Chiung-Jung Yang, Yu-Han Chen, Sun-Yuan Hsieh (2025)

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DOI: 10.1007/S11227-025-07113-0

access: closed

type: Journal Article

metadata version: 2025-04-07

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Chiung-Jung Yang, Yu-Han Chen, Sun-Yuan Hsieh:
Enhanced wafer map defect pattern classification through stacking ensemble method and data augmentation integration. J. Supercomput. 81(5): 643 (2025)

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