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"Pattern Classification With Corrupted Labeling via Robust Broad Learning ..."

Junwei Jin, Yanting Li, C. L. Philip Chen (2022)

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DOI: 10.1109/TKDE.2021.3049540

access: closed

type: Journal Article

metadata version: 2022-10-18

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Junwei Jin, Yanting Li, C. L. Philip Chen:
Pattern Classification With Corrupted Labeling via Robust Broad Learning System. IEEE Trans. Knowl. Data Eng. 34(10): 4959-4971 (2022)

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