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"Generating Representative Test Sequences from Real Workload for Minimizing ..."

Yoonah Paik et al. (2020)

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DOI: 10.1145/3391891

access: closed

type: Journal Article

metadata version: 2020-10-08

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Yoonah Paik, Seon Wook Kim, Dongha Jung, Minseong Kim:
Generating Representative Test Sequences from Real Workload for Minimizing DRAM Verification Overhead. ACM Trans. Design Autom. Electr. Syst. 25(4): 30:1-30:23 (2020)

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