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"Using stuck-at tests to form scan-based tests for transition faults in ..."

Irith Pomeranz, Sudhakar M. Reddy (2009)

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DOI: 10.1145/1640457.1640464

access: closed

type: Journal Article

metadata version: 2018-11-06

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Irith Pomeranz, Sudhakar M. Reddy:
Using stuck-at tests to form scan-based tests for transition faults in standard-scan circuits. ACM Trans. Design Autom. Electr. Syst. 15(1): 7:1-7:22 (2009)

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