"Influential Global and Local Contexts Guided Trace Representation for ..."

Zhuo Zhang et al. (2023)

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DOI: 10.1145/3576043

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type: Journal Article

metadata version: 2023-07-21

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Zhuo Zhang, Yan Lei, Ting Su, Meng Yan, Xiaoguang Mao, Yue Yu:
Influential Global and Local Contexts Guided Trace Representation for Fault Localization. ACM Trans. Softw. Eng. Methodol. 32(3): 78:1-78:27 (2023)

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