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"A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes ..."
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling (2016)
- Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling
:
A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks. IEEE Trans. Reliab. 65(1): 469-485 (2016)
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