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"Reliability Analysis of H-Tree Random Access Memories Implemented With ..."

Costas Argyrides et al. (2011)

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DOI: 10.1109/TR.2011.2161131

access: closed

type: Journal Article

metadata version: 2021-09-03

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Costas Argyrides, Raul Chipana, Fabian Vargas, Dhiraj K. Pradhan:
Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction. IEEE Trans. Reliab. 60(3): 528-537 (2011)

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