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"Competing causes of failure and reliability tests for Weibull lifetimes ..."

Uditha Balasooriya, Chan-Kee Low (2004)

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DOI: 10.1109/TR.2003.821947

access: closed

type: Journal Article

metadata version: 2020-07-09

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Uditha Balasooriya, Chan-Kee Low:
Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring. IEEE Trans. Reliab. 53(1): 29-36 (2004)

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