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"Improvement on "Sequential Testing" in MIL-HDBK-781A and IEC 61124."

Yefim Haim Michlin, Lyubov Meshkov, Irit Grunin (2008)

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DOI: 10.1109/TR.2008.916886

access: closed

type: Journal Article

metadata version: 2020-07-09

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Yefim Haim Michlin, Lyubov Meshkov, Irit Grunin:
Improvement on "Sequential Testing" in MIL-HDBK-781A and IEC 61124. IEEE Trans. Reliab. 57(2): 379-387 (2008)

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