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"Accelerated Degradation Testing With Long-Term Memory Effects."

Wujun Si, Yunfei Shao, Wei Wei (2020)

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DOI: 10.1109/TR.2020.2997404

access: closed

type: Journal Article

metadata version: 2020-12-31

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Wujun Si, Yunfei Shao, Wei Wei:
Accelerated Degradation Testing With Long-Term Memory Effects. IEEE Trans. Reliab. 69(4): 1254-1266 (2020)

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