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"Novel Double-Node-Upset-Tolerant Memory Cell Designs Through ..."

Aibin Yan et al. (2019)

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DOI: 10.1109/TR.2018.2876243

access: closed

type: Journal Article

metadata version: 2020-07-09

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Aibin Yan, Zhen Wu, Jing Guo, Jie Song, Xiaoqing Wen:
Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design and Layout. IEEE Trans. Reliab. 68(1): 354-363 (2019)

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