"Orthogonal Defect Classification - A Concept for In-Process Measurements."

Ram Chillarege et al. (1992)

> Home

Details and statistics

DOI: 10.1109/32.177364

access: closed

type: Journal Article

metadata version: 2017-05-17

- view
  authority control:
- export record
  dblp key:
  - journals/tse/ChillaregeBCHMRW92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tse/ChillaregeBCHMRW92
Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong:
Orthogonal Defect Classification - A Concept for In-Process Measurements. IEEE Trans. Software Eng. 18(11): 943-956 (1992)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.