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"On testing of sequential machines using circuit decomposition and ..."
Sunil R. Das et al. (1995)
- Sunil R. Das, Wen-Ben Jone, Amiya R. Nayak, Ian Choi:
On testing of sequential machines using circuit decomposition and stochastic modeling. IEEE Trans. Syst. Man Cybern. 25(3): 489-504 (1995)
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