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"Optimal and near-optimal test sequencing algorithms with realistic test ..."

Vijay Raghavan, Mojdeh Shakeri, Krishna R. Pattipati (1999)

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DOI: 10.1109/3468.736357

access: closed

type: Journal Article

metadata version: 2020-05-25

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  - journals/tsmc/RaghavanSP99
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  - https://dblp.org/rec/journals/tsmc/RaghavanSP99
Vijay Raghavan, Mojdeh Shakeri, Krishna R. Pattipati:
Optimal and near-optimal test sequencing algorithms with realistic test models. IEEE Trans. Syst. Man Cybern. Part A 29(1): 11-26 (1999)

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